Title :
Small and large angle precession in exchange biased bilayers
Author :
Weber, M.C. ; Nembach, H. ; Hillebrands, B. ; Fassbender, J.
Author_Institution :
Fachbereich Phys. und Forschungsschwerpunkt, Technische Univ. Kaiserslautern, Germany
Abstract :
Both small and large angle precession of a ferromagnetic layer upon photoexcitation can be modeled with reasonable values of the Gilbert parameter within the Landau-Lifshitz and Gilbert framework. Employing the known antiferromagnetic thickness dependence of the exchange bias field, the exchange bias field dependence of the Gilbert parameter is investigated. For this purpose, a wedge shaped exchange bias bilayer with a fixed thickness of the ferromagnetic layer and a varying thickness of the antiferromagnetic layer along the sample is prepared and measured. The extracted Gilbert parameter from the time-resolved Kerr traces, hence the dissipation rate, increases linearly with the exchange bias field magnitude. Local fluctuations of the interfacial coupling due to interface roughness can increase the two-magnon relaxation probability, which in terms of an additional dissipation channel finally leads to an increased Gilbert damping parameter.
Keywords :
antiferromagnetic materials; exchange interactions (electron); ferromagnetic materials; ferromagnetic relaxation; interface roughness; magnons; photoexcitation; Gilbert damping parameter; Landau-Lifshitz framework; antiferromagnetic layer; antiferromagnetic thickness dependence; dissipation rate; exchange bias field; exchange biased bilayers; ferromagnetic layer; interfacial coupling; large angle precession; photoexcitation; small angle precession; time-resolved Kerr traces; two-magnon relaxation probability; Anisotropic magnetoresistance; Antiferromagnetic materials; Damping; Geometry; Laser excitation; Magnetic field measurement; Magnetization; Optical pulses; Pump lasers; Temperature;
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
DOI :
10.1109/INTMAG.2005.1464246