Influence of layering of NiO/NiFe on exchange bias

Author

Kuanr, Alka V. ; Kuanr, B.K.

Author_Institution

Coll. of Appl. Sci. for Women, Delhi Univ., India

fYear

2005

fDate

4-8 April 2005

Firstpage

1631

Lastpage

1632

Abstract

The exchange anisotropy in a NiO/NiFe films deposited via ion-beam sputtering is studied using magneto-optic Kerr effect (MOKE), network analyzer ferromagnetic resonance and Brillouin light scattering method. This is to determine the influence of interface versus bulk contributions in the exchange biased structures. The results show a very strong increase on the exchange bias, H_ex, by dividing the NiFe layer, thereby increasing the number of interfaces. The effects of H_ex on the resonance frequency and the linewidth like MOKE hysteresis loop shift and increased coercivity are also examined using network analyzer spectroscopy.

Keywords

Brillouin spectra; Kerr magneto-optical effect; coercive force; exchange interactions (electron); ferromagnetic materials; ferromagnetic resonance; iron alloys; magnetic anisotropy; magnetic hysteresis; magnetic thin films; nickel alloys; nickel compounds; sputtered coatings; Brillouin light scattering; NiO-NiFe; coercivity; exchange anisotropy; exchange bias; hysteresis loop; ion-beam sputtering; magneto-optic Kerr effect; network analyzer ferromagnetic resonance; network analyzer spectroscopy; resonance frequency; Anisotropic magnetoresistance; Brillouin scattering; Hysteresis; Kerr effect; Light scattering; Magnetic analysis; Magnetic resonance; Magnetooptic effects; Resonant frequency; Sputtering;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International

Print_ISBN

0-7803-9009-1

Type

conf

DOI

10.1109/INTMAG.2005.1464249

Filename

1464249