Harum Manis mango dielectric properties based on maturity

Author

Juni, Khairudi Mohd ; Malek, Mohd Fareq Abd ; Ahmed, Manjur ; Meng, Cheng Ee

Author_Institution

Electr. Eng. Dept., Politek. Tuanku Syed Sirajuddin, Arau, Malaysia

fYear

2011

fDate

12-14 Dec. 2011

Firstpage

19

Lastpage

20

Abstract

This paper presents Harum Manis mango maturity characterizations based on dielectric properties. Currently, Harum Manis maturity is determined by referring to number of weeks of growth and farmer experience. This paper proposes a quick and simple microwave measurement technique. An open ended dielectric probe is used to measure dielectric properties of Harum Manis mango for frequency range from 500 MHz until 20 GHz. The relationship between dielectric constant and loss factor as well as week of growth is established. These data contributes to further research of Harum Manis maturity sensor application.

Keywords

dielectric properties; microwave measurement; Harum Manis mango dielectric properties; Harum Manis maturity sensor application; dielectric constant; dielectric property measurement; frequency 500 MHz to 20 GHz; microwave measurement technique; open ended dielectric probe; Dielectric constant; Dielectric losses; Dielectric measurements; Materials; Microwave measurements; Probes; Harum Manis mango; dielectric properties; maturity; open ended probe;

fLanguage

English

Publisher

ieee

Conference_Titel

RF and Microwave Conference (RFM), 2011 IEEE International

Conference_Location

Seremban, Negeri Sembilan

Print_ISBN

978-1-4577-1628-7

Type

conf

DOI

10.1109/RFM.2011.6168685

Filename

6168685