DocumentCode
3538841
Title
Element specific hysteresis loops of Co and Fe in annealed CoFe/Cu multilayers
Author
Beal, M.S. ; Hase, T.P.A. ; Thompson, S.M. ; Tanner, B.K. ; Grabis, Janis ; Zabel, H.
Author_Institution
Dept. of Phys., York Univ., UK
fYear
2005
fDate
4-8 April 2005
Firstpage
1709
Lastpage
1710
Abstract
Sets of antiferromagnetically aligned [Co90Fe10/Cu]6 multilayers are grown by magnetron sputtering on buffered Si(001) substrates and are then subjected to ex-situ annealing in a high vacuum furnace for 1 hour at 450°C. The element specific magnetic roughness and hysteresis behaviour corresponding to the ferromagnetic (FM) and antiferromagnetic ordering are obtained as a function of the annealing temperature of the multilayers. The measurements taken at the L3 resonance show significant differences in the magnetic interface roughness. The intensity of the FM peak at the Co L3 edge shows the greatest similarity to the bulk [Co90Fe10/Cu]6 VSM data. However, the Fe data reveals differences in the Fe behaviour compared to the Co in both the approach to saturation and in the switching itself. The post annealed giant magnetoresistance is also studied as a function of the annealing temperature.
Keywords
annealing; antiferromagnetic materials; cobalt alloys; copper; ferromagnetic materials; giant magnetoresistance; iron alloys; magnetic hysteresis; magnetic multilayers; magnetic thin films; magnetometers; sputter deposition; 1 hour; 450 degC; CoFe-Cu; L3 resonance; Si; VSM data; annealing; annealing temperature; antiferromagnetic ordering; antiferromagnetically aligned; element specific magnetic roughness; ferromagnetic ordering; giant magnetoresistance; hysteresis loops; magnetic interface roughness; magnetron sputtering; Annealing; Antiferromagnetic materials; Iron; Magnetic hysteresis; Magnetic multilayers; Magnetic resonance; Nonhomogeneous media; Saturation magnetization; Sputtering; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN
0-7803-9009-1
Type
conf
DOI
10.1109/INTMAG.2005.1464288
Filename
1464288
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