A study of noise effects due to the diode protection for shield resistance measurement of GMR recording heads

Author

Siritaratiwat, A. ; Tongsomporn, D. ; Chooruang, K. ; Afzulpurka, N.

Author_Institution

Dept. of Electr. Eng., Khon Kaen Univ., Thailand

fYear

2005

fDate

4-8 April 2005

Firstpage

1715

Lastpage

1716

Abstract

This paper examines the noise effect of protection diodes used for protecting voltage breakdown during MR-shield resistance measurement in quasi-static test (QST) for giant magnetoresistive heads (GMR). Two fasions of diode protection are presented and the noise behavior of them are discussed and compared in terms of GMR noise test.

Keywords

electric resistance measurement; giant magnetoresistance; magnetic heads; magnetic recording noise; GMR noise test; GMR recording heads; MR-shield resistance measurement; diode protection; giant magnetoresistive heads; noise effects; protection diodes; quasistatic test; shield resistance measurement; voltage breakdown; Electric breakdown; Electrical resistance measurement; Giant magnetoresistance; Magnetic heads; Magnetic noise; Noise level; Probes; Protection; Schottky diodes; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International

Print_ISBN

0-7803-9009-1

Type

conf

DOI

10.1109/INTMAG.2005.1464291

Filename

1464291

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3538866