DocumentCode :
3539458
Title :
Micromagnetic domain structures and magnetization switching mechanism in submicron thin film elements
Author :
Choi, B.C. ; Pujada, B.R. ; Hong, Y.K. ; Park, M.H. ; Han, H. ; Gee, S.H. ; Donohoe, G.W.
Author_Institution :
Dept. of Phys. & Astron., Victoria Univ., BC, Canada
fYear :
2005
fDate :
4-8 April 2005
Firstpage :
1845
Lastpage :
1846
Abstract :
Experimental and numerical micromagnetic studies of the magnetization configuration and switching process in Pac-man (PM) shaped Ni80Fe20 samples with different geometries defined by the variation of the slot angle were presented. Scanning electron microscope images of patterned PM-I and PM-II magnetic elements were shown. These permalloy films were sputter deposited and their magnetic configurations were measured. The results concluded that vortex core formation and vortex-driven complex magnetization reversal can be effectively suppressed by modifying the slot angles. The hysteresis loops and domain configurations during the reversal implied that PM-II elements with large slot angles were more suitable for magnetic random access memory (MRAM) applications.
Keywords :
Permalloy; ferromagnetic materials; magnetic domains; magnetic hysteresis; magnetic thin films; magnetisation reversal; micromagnetics; scanning electron microscopy; Ni80Fe20; Pac-man shaped samples; domain configurations; hysteresis loops; magnetic configurations; magnetic elements; magnetic random access memory applications; magnetization configuration; magnetization switching mechanism; micromagnetic domain structures; permalloy films; scanning electron microscope; slot angle; sputter deposition; submicron thin film elements; vortex core formation; vortex-driven complex magnetization reversal; Geometry; Iron; Magnetic domains; Magnetic films; Magnetic force microscopy; Magnetic switching; Magnetization; Micromagnetics; Scanning electron microscopy; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
Type :
conf
DOI :
10.1109/INTMAG.2005.1464356
Filename :
1464356
Link To Document :
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