• DocumentCode
    3539826
  • Title

    Sensitivity approach for eigenmode characterization of structures with open boundary conditions

  • Author

    Bandlow, B. ; Schuhmann, R.

  • Author_Institution
    Fachgebiet Theor. Elektrotechnik, Tech. Univ. Berlin, Berlin, Germany
  • fYear
    2013
  • fDate
    9-13 Sept. 2013
  • Firstpage
    855
  • Lastpage
    858
  • Abstract
    The computational models of open resonant nanophotonic structures include perfectly matched layers in order to realize a proper transition to free-space for the electromagnetic waves. As a consequence, the eigenvalue spectrum is spoilt by unwanted eigenmodes which are trapped within these layers. In the context of the finite integration technique we apply a computational inexpensive sensitivity analysis in order to identify those undesired eigenmodes.
  • Keywords
    eigenvalues and eigenfunctions; electromagnetic waves; integration; nanophotonics; resonance; sensitivity analysis; computational models; eigenmode characterization; eigenvalue spectrum; electromagnetic waves; finite integration technique; open boundary conditions; open resonant nanophotonic structures; sensitivity analysis; Computational modeling; Dielectrics; Eigenvalues and eigenfunctions; Materials; Perfectly matched layers; Sensitivity analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetics in Advanced Applications (ICEAA), 2013 International Conference on
  • Conference_Location
    Torino
  • Print_ISBN
    978-1-4673-5705-0
  • Type

    conf

  • DOI
    10.1109/ICEAA.2013.6632358
  • Filename
    6632358