Title :
A diagnostic reconfiguration methodology for integrated systems
Author :
Sharif, Erfaan ; Richardson, Andrew ; Dorey, Tony
Author_Institution :
Dept. of Eng., Lancaster Univ., UK
Abstract :
An Integrated Diagnostic Reconfiguration (IDR) methodology is described using a design example of a smart sensor to illustrate and clarify the techniques involved. Using circuit reconfiguration techniques, IDR can provide improved fault tolerance and self validation of mixed signal integrated systems
Keywords :
mixed analogue-digital integrated circuits; ASIC; circuit reconfiguration techniques; diagnostic reconfiguration methodology; fault tolerance; mixed signal integrated systems; self validation; smart sensors;
Conference_Titel :
Testing Mixed Signal Circuits and Systems (Ref. No: 1997/361), IEE Colloquium on
Conference_Location :
London
DOI :
10.1049/ic:19971194
