Title :
Modeling of periodic and quasi-periodic structures by the MoM/BI-RME method
Author :
Perregrini, Luca ; Bozzi, Maurizio ; Pasian, Marco
Author_Institution :
Dept. of Electr., Univ. of Pavia, Pavia, Italy
Abstract :
This paper outline the basic theory and describes the most significant applications of the MoM/BI-RME method for the modeling of either planar periodic or shielded structures. This method is based on the solution of an integral equation by the Method of Moments (MoM) with entire-domain basis functions. In the case of arbitrarily shaped domains, the basis functions are calculated numerically by the Boundary Integral-Resonant Mode Expansion (BI-RME) method. The MoM/BI-RME method has been applied to the modeling of frequency selective surfaces under plane wave illumination, reflectarrays, shielded microwave printed circuits, and metallo-dielectric electromagnetic band-gap structures. Moreover, it is shown how the combination of the MoM/BI-RME with a plane-wave expansion of the impinging field allows for the determination of the transmitted/reflected electromagnetic field by a periodic surface under an arbitrary illumination.
Keywords :
boundary integral equations; electric field integral equations; electromagnetic shielding; electromagnetic wave reflection; electromagnetic wave transmission; frequency selective surfaces; magnetic field integral equations; method of moments; periodic structures; photonic band gap; printed circuits; MoM-BI-RME method; arbitrarily shaped domain; boundary integral-resonant mode expansion method; electromagnetic field transmission-reflection; entire-domain basis function; frequency selective surface; integral equation; metallodielectric electromagnetic band-gap structure; method of moment; planar periodic structure; plane wave illumination; plane-wave expansion; quasiperiodic structure; reflectarray; shielded microwave printed circuit; shielded structure; Feeds; Frequency selective surfaces; Metals; Method of moments; Periodic structures;
Conference_Titel :
Electromagnetics in Advanced Applications (ICEAA), 2013 International Conference on
Conference_Location :
Torino
Print_ISBN :
978-1-4673-5705-0
DOI :
10.1109/ICEAA.2013.6632393