DocumentCode :
3540137
Title :
Non-invasive vectorial electric field characterization with optical probes
Author :
Gaborit, Gwenael ; Lecoche, Frederic ; Dahdah, Jean ; Duraz, Eric ; Duvillaret, Lionel ; Lasserre, Jean-Louis
Author_Institution :
IMEP-LAHC, Univ. de Savoie, Le Bourget-du-Lac, France
fYear :
2013
fDate :
9-13 Sept. 2013
Firstpage :
1016
Lastpage :
1019
Abstract :
This paper describes electric field sensors based on electro-optic technique. The principle is explained and the effect is optimized within a pigtailed electro-optic probe. The performances are fully evaluated, in terms of linearity, dynamics, vectorial selectivity, bandwidth and disturbance on the field to be measured. Some examples of application such as mapping of E-field in guided configuration are demonstrated.
Keywords :
electric field measurement; electro-optical devices; bandwidth; disturbance; dynamics; electric field sensors; electro-optic technique; field measurement; guided configuration; linearity; noninvasive vectorial electric field characterization; optical probes; pigtailed electro-optic probe; vectorial selectivity; Bandwidth; Crystals; Laser beams; Measurement by laser beam; Optical sensors; Probes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetics in Advanced Applications (ICEAA), 2013 International Conference on
Conference_Location :
Torino
Print_ISBN :
978-1-4673-5705-0
Type :
conf
DOI :
10.1109/ICEAA.2013.6632395
Filename :
6632395
Link To Document :
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