DocumentCode :
3540331
Title :
A generalized modeling approach for the frequency shift in near-field scanning microwave microscopes
Author :
Niegemann, Jens
Author_Institution :
Lab. for Electromagn. Fields, ETH Zurich, Zurich, Switzerland
fYear :
2013
fDate :
9-13 Sept. 2013
Firstpage :
1145
Lastpage :
1148
Abstract :
In most Near-Field Scanning Microwave Microscope (NSMM) setups, changes of the dielectric environment in the vicinity of the tip are detected by measuring the detuning of a resonator connected to the tip. In this work, we propose a novel, semi-analytic approach to model the frequency shift of this resonator. In contrast to the traditional procedures, our method allows to model arbitrary tip shapes while still offering fast computations. Specifically, we combine a static boundary element calculation with a numerical integration procedure to evaluate overlap integral occurring expressions obtained by traditional perturbation theory.
Keywords :
boundary-elements methods; microwave resonators; perturbation theory; arbitrary tip shapes; dielectric environment; frequency shift; generalized modeling approach; near-field scanning microwave microscope setups; numerical integration procedure; overlap integral occurring expressions; perturbation theory; resonator detuning; semianalytic approach; static boundary element calculation; Computational modeling; Dielectrics; Integral equations; Mathematical model; Microscopy; Microwave theory and techniques; Resonant frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetics in Advanced Applications (ICEAA), 2013 International Conference on
Conference_Location :
Torino
Print_ISBN :
978-1-4673-5705-0
Type :
conf
DOI :
10.1109/ICEAA.2013.6632422
Filename :
6632422
Link To Document :
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