Title :
Microwave composites filled with ferromagnetic films
Author :
Iakubov, I.T. ; Lagarkov, A.N. ; Maklakov, S.A. ; Osipov, A.V. ; Rozanov, K.N. ; Ryzhikov, I.A. ; Starostenko, S.N.
Author_Institution :
Inst. for Theor. & Appl. Electromagn., Moscow, Russia
Abstract :
For many technical applications, magnets with high microwave permeability are needed. For such magnets, both static permeability μs and the ferromagnetic resonance frequency fr must be high. These values depend greatly on the manufacturing process of the magnet, though are tightly related each to other. The microwave performance of bulk magnets is governed by well known Snoek´s law. According to computations, thin films are better than bulk magnets in their potential microwave performance. Also, thin ferromagnetic films may have the highest microwave permeability values of all magnets. However, bulk samples are necessary for most applications. As ferromagnets are conductors, the high-frequency behavior of thick ferromagnetic films may be due to the effect of eddy currents rather than due to the ferromagnetic resonance. For normally incident waves, dielectric response arising because of the conductivity is dominant over the magnetic response. These drawbacks are overcame with the use of magnetic composites filled with pieces of thin ferromagnetic films. In this case, μs and fr are still related, with the volume fraction of the magnetic films, p, and a proper randomization factor being introduced as a factor. It is easily estimated that even at small p, e.g., p=0.1 and with the values of fr and 4πMo, μ≈20 that is still larger than the-values typical for microwave ferrites.
Keywords :
composite materials; ferrites; ferromagnetic resonance; magnetic thin films; permeability; Snoeks law; bulk magnets; ferromagnetic resonance frequency; manufacturing process; microwave composites; microwave ferrites; microwave permeability; randomization factor; static permeability; thin ferromagnetic films; Conductive films; Dielectric thin films; Eddy currents; Magnetic films; Magnetic resonance; Magnets; Manufacturing processes; Permeability; Resonant frequency; Transistors;
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
DOI :
10.1109/INTMAG.2005.1464472