Mixed signal test development in a virtual test environment

Virtual test development was completed on a complex mixed-signal IC currently under development within Analog Devices. Adopting a virtual test approach saved valuable product development time through concurrent design and test development. Almost all of the advantages of test simulation were realised by this pilot project, as witnessed by the reduction in post-silicon debug time. However, if virtual test technology is to succeed long term,the challenge of dramatically reducing the simulation times will have to be addressed, as currently, the productivity of a test engineer working in such an environment is low relative to the more traditional approach