Title :
An integrated optical waveguide isolator based on multi mode interference by wafer direct bonding
Author :
Roh, I.W. ; Yang, J.S. ; Lee, S. ; Woo, D.H. ; Mizumoto, Tetsuya ; Lee, W.Y.
Author_Institution :
Dept. of Material Sci. & Eng., Yonsei Univ., Seoul, South Korea
Abstract :
An integrated optical waveguide isolator by wafer direct bonding between the InGaAsP and Ce:YIG is reported. The layer structure of multi-mode section of the optical isolator is Ce:YIG/InGaAsP/InP. An external magnetic field is applied to the device to measure the optical isolation ratio. The isolation ratio was found to be 2.9 dB.
Keywords :
III-V semiconductors; cerium; gallium arsenide; gallium compounds; indium compounds; integrated optics; light interference; optical communication equipment; optical isolators; optical waveguides; wafer bonding; yttrium compounds; YFe5O12:Ce-InGaAsP-InP; YIG:Ce-InGaAsP-InP; external magnetic field; integrated optical waveguide isolator; multi mode interference; optical isolation ratio; wafer direct bonding; Indium phosphide; Integrated optics; Interference; Isolators; Magnetic field measurement; Optical devices; Optical films; Optical waveguides; Semiconductor waveguides; Wafer bonding;
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
DOI :
10.1109/INTMAG.2005.1464480
