DocumentCode :
3540418
Title :
Electromagnetic analysis of fringed microstrip lines on porosified LTCC
Author :
Talai, Armin ; Steinhauser, Frank ; Gmeiner, B. ; Bittner, Achim ; Rude, Ulrich ; Schmid, Ulrich ; Weigel, Robert ; Koelpin, Alexander
Author_Institution :
Inst. for Electron. Eng., Friedrich-Alexander-Univ., Erlangen-Nuremberg, Germany
fYear :
2013
fDate :
9-13 Sept. 2013
Firstpage :
1189
Lastpage :
1192
Abstract :
Recent investigations demonstrated that porosification of LTCC enables a local modification of material properties, in particular of the effective permittivity. These studies revealed that the electric field strength is highest at the lower conductor track edges on the porosified substrate. The local field strength peaks cause substantial influence on the effectiveness of permittivity reduction due near-surface material abrasions. In this paper, the influences of these randomly fringed boundaries on electromagnetic properties are investigated for different degrees of fraying. The gained results are compared to measured screen print edges by scanning electron microscope image analysis of co-fired and post-fired gold conductors, and will contribute for reliable circuit design on porous LTCC in the future.
Keywords :
abrasion; ceramics; conductors (electric); firing (materials); gold; microstrip lines; permittivity; scanning electron microscopy; Au; co-fired gold conductors; electric field strength; electromagnetic analysis; fraying; fringed microstrip lines; low temperature cofired ceramics; near-surface material abrasions; permittivity; porosification; porosified LTCC; post-fired gold conductors; reliable circuit design; scanning electron microscope image analysis; screen print edges; Conductors; Decision support systems; Materials; Metals; Permittivity; Shape; Conductor edge; LTCC; cofired; field simulation; fringed microstrip; inhomogeneous substrate; porosification; reduction of permittivity; structural modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetics in Advanced Applications (ICEAA), 2013 International Conference on
Conference_Location :
Torino
Print_ISBN :
978-1-4673-5705-0
Type :
conf
DOI :
10.1109/ICEAA.2013.6632433
Filename :
6632433
Link To Document :
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