Title :
Development of high-precision temperature measurement system based on ARM
Author :
Xianjun, Yi ; Cuimei, Liu
Author_Institution :
Sch. of Electr. & Inf. Eng., Wuhan Inst. of Technol., Wuhan, China
Abstract :
The high-precision temperature measurement system which adopts ARM processor LM3S1138 as controlling core was introduced in this paper. In the temperature measuring circuits, the current driving circuit of sensor Pt100A and A/D converting circuit adopt the same reference voltage, which makes A/D conversion results are only dependent on the changing value of platinum resistance with the temperature change DeltaRT, and will not be affected by the stability of sensor constant current drive current and the reference voltage accuracy of A/D converter, the design method has improved the sampling accuracy of the system hardware effectively. In the software calibration of measurement error, least squares method was used to fit the ldquosampling value - temperaturerdquo curve in connection with the measured data of various temperature sections, it offsets the deviation which occurred in various intermediate links of the signal from platinum resistance to the A/D conversion in the temperature measurement of Pt100A. In the temperature measurement process, ARM processor do real-time computing to get final temperature measurement results according to the A/D sample value and combined with the polynomial of sub-fitting actual measurement results show that, the system temperature deviation is less than 0.05degC.
Keywords :
analogue-digital conversion; computerised instrumentation; least squares approximations; measurement errors; measurement systems; microprocessor chips; polynomials; signal sampling; temperature measurement; A/D converting circuit; ARM processor LM3S1138; current driving circuit; high-precision temperature measurement system; least squares method; measurement error; polynomial; real-time computing; sensor constant current drive current; signal sampling; temperature measuring circuit; Circuits; Electrical resistance measurement; Platinum; Process control; Sensor systems; Temperature control; Temperature dependence; Temperature measurement; Temperature sensors; Voltage; ARM; curve fitting; high-precision measurement; least squares method; temperature detection circuit;
Conference_Titel :
Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-3863-1
Electronic_ISBN :
978-1-4244-3864-8
DOI :
10.1109/ICEMI.2009.5274028