• DocumentCode
    3540885
  • Title

    Detection and Identification of EM Field Source by Using Support Vector Machines

  • Author

    Mo, Fan ; Lu, Yinghua ; Zhang, Jinlin

  • fYear
    2012
  • fDate
    21-23 Sept. 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    An approach of tempest analysis is introduced and a method of detection and identification of electromagnetic emitting systems by intentionally or unintentionally is applied and discussed. Based on Support Vector Machine(SVM) algorithm, digital signal process method, this paper investigates an primary procedure involving red/black separation and classifying the emission sources radiated from electronics equipments such as the PCB layout or others. The transmission of digital clock and oscillation in ARM embedded system including tracks configuration and I/O Ports is taken into consideration. A set of computed spectra data of emission caused by PCB is adopted for the learning process. A simplify method to train the SVM is used by extracting the characters like the mean of magnitude, standard deviation and other parameters extracted from the data.
  • Keywords
    Accuracy; Clocks; Computational modeling; Electromagnetics; Force; Support vector machines; Training;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wireless Communications, Networking and Mobile Computing (WiCOM), 2012 8th International Conference on
  • Conference_Location
    Shanghai, China
  • ISSN
    2161-9646
  • Print_ISBN
    978-1-61284-684-2
  • Type

    conf

  • DOI
    10.1109/WiCOM.2012.6478493
  • Filename
    6478493