• DocumentCode
    3541179
  • Title

    Multiple data storage of URAM (Unified-RAM) with multi dual cell (MDC) method

  • Author

    Bae, Dong-Il ; Gu, Bonsang ; Ryu, Seong-Wan ; Cho, Yang-Kyu

  • Author_Institution
    Div. of EE, Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
  • fYear
    2008
  • fDate
    15-16 June 2008
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    A multi-functional URAM (Unified-RAM) showing both 1T DRAM and flash memory characteristics at one cell is demonstrated. For flash memory characteristics, we fabricated a conventional floating body SOI NMOSFET with O/N/O stacks as a front gate. By combining two different operation modes of URAM, multiple data storage is demonstrated with a multi-dual cell (MDC).
  • Keywords
    DRAM chips; MOSFET; flash memories; silicon-on-insulator; 1T DRAM; O/N/O stacks; URAM; flash memory characteristics; floating body SOI NMOSFET; multidual cell method; multiple data storage; unified-RAM; Capacitance; Costs; Fabrication; Flash memory; Lithography; MOSFET circuits; Mechanical factors; Nonvolatile memory; Random access memory; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Silicon Nanoelectronics Workshop, 2008. SNW 2008. IEEE
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    978-1-4244-2071-1
  • Type

    conf

  • DOI
    10.1109/SNW.2008.5418416
  • Filename
    5418416