• DocumentCode
    3541362
  • Title

    Multifractal analysis of self-similar processes

  • Author

    Wendt, H. ; Jaffard, S. ; Abry, P.

  • Author_Institution
    IRIT, ENSEEIHT, Toulouse, France
  • fYear
    2012
  • fDate
    5-8 Aug. 2012
  • Firstpage
    69
  • Lastpage
    72
  • Abstract
    Scale invariance and multifractal analysis are nowadays widely used in applications. For modeling scale invariance in data, two classes of processes are classically in competition: self-similar processes and multiplicative cascades. They imply fundamentally different underlying (additive or multiplicative) mechanisms, hence the crucial practical need for data driven model selection. Such identification relies on properties often associated with the former: self-similarity, monofractality, linear scaling function, null c2 parameter. By performing a wavelet leader based analysis of the multifractal properties of a large variety of self-similar processes, the present work contributes to a better disentangling of these different properties, sometimes confused one with another. Also, it leads to the formulation of conjectures regarding the scaling and multifractal properties of self-similar processes.
  • Keywords
    data analysis; fractals; data analysis; data driven model selection; linear scaling function; monofractality; multifractal analysis; multifractal properties; multiplicative cascades; null c2 parameter; scale invariance; self-similar processes; wavelet leader based analysis; Data models; Estimation; Fractals; Upper bound; Wavelet analysis; Wavelet transforms; monofractal; multifractal analysis; scaling function; self-similar; wavelet leader;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Statistical Signal Processing Workshop (SSP), 2012 IEEE
  • Conference_Location
    Ann Arbor, MI
  • ISSN
    pending
  • Print_ISBN
    978-1-4673-0182-4
  • Electronic_ISBN
    pending
  • Type

    conf

  • DOI
    10.1109/SSP.2012.6319798
  • Filename
    6319798