• DocumentCode
    3541683
  • Title

    Quantum simulation study of dual-material double gate (DMDG) MOSFET: NEGF approach

  • Author

    Arefinia, Zahra ; Orouji, Ali A.

  • Author_Institution
    Dept. of Electr. Eng., Semnan Univ., Semnan, Iran
  • fYear
    2008
  • fDate
    15-16 June 2008
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    To combine the advantages of both DG (dual material gate) structures, in this paper we simulate the dual material double gate (DMDG) SOI MOSFET. We use 2D quantum simulation which is based on the self-consistent solution of the 2D Poisson-Schrodinger equation with open boundary conditions, within the non-equilibrium Green´s function (NEGF) formulation.
  • Keywords
    Green´s function methods; MOSFET; electron density; DMDG structure; MOSFET; NEGF approach; drain induced barrier lowering; drain source voltages; dual material double gate; electron density; gate source biases; nonequilibrium Green´s function; poly front gate; quantum simulation study; threshold voltage; transconductance; voltage 0.05 V; Analytical models; Electron devices; Large-scale systems; MOSFET circuits; Potential energy; Predictive models; Production; Silicon on insulator technology; Threshold voltage; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Silicon Nanoelectronics Workshop, 2008. SNW 2008. IEEE
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    978-1-4244-2071-1
  • Type

    conf

  • DOI
    10.1109/SNW.2008.5418485
  • Filename
    5418485