Quantitative evaluation of texture characteristics of solar cell back reflectors

A quantitative characterization technique was developed to study the surface morphology of solar cell back reflector. The texture characteristics of back reflectors have strong effects on solar cell efficiency. While average peak height and roughness are directly available from atomic force microscopy (AFM) analysis, several key parameters are missing. These parameters include average peak angle, peak angle distribution, and peak height distribution. This work demonstrates a numerical scheme to quantify these texture parameters. To do this, we developed a program that calculates the peak height and angle from the original AFM data. The output results establish quantitative relationship between the back reflector process parameters and the texture characteristics.