Title :
Schottky diode parameters extraction using two different methods
Author :
Aazou, Safae ; Assaid, E.-M.
Author_Institution :
Fac. des Sci., Univ. Chouaib Doukkali, El Jadida, Morocco
Abstract :
In the present study, we determine exact analytical expression of the current flow through a Schottky barrier diode as a function of the input voltage. The Schottky diode is modeled by an electronic circuit containing four physical parameters: a series resistance Rs, a shunt resistance Rsh, a Schottky diode reverse saturation current Is and a Schottky diode ideality factor ¿. Firstly, we solve the characteristic equation and determine the analytical expression of the input current I as a function of the input voltage of the Schottky diode V using the LambertW Function. Secondly, We present two different methods to extract the four physical parameters appearing in the electronic circuit. These methods are applied for two junctions: Iridium-Silicon Carbide Schottky barrier diode at 200 K and Gold-Gallium Arsenide at 300 K. Finally, we compare the results obtained via the two methods presented.
Keywords :
Schottky diodes; semiconductor device models; Schottky barrier diode; parameters extraction; series resistance; shunt resistance; temperature 200 K; temperature 300 K; Approximation methods; Current-voltage characteristics; Electronic circuits; Equations; Microelectronics; Optimization methods; Parameter extraction; Schottky barriers; Schottky diodes; Voltage;
Conference_Titel :
Microelectronics (ICM), 2009 International Conference on
Conference_Location :
Marrakech
Print_ISBN :
978-1-4244-5814-1
DOI :
10.1109/ICM.2009.5418642