Testability evaluation for analog linear circuits via transfer function analysis

Efficient symbolic procedures for testability measures and ambiguity groups determination have been presented in the literature in the last decade. These procedures make use of the evaluation of the rank of the Jacobian matrix of the fault equations, and thus they are valid only in a limited range of fault values. In this paper, a new approach is presented that overcomes this limit, by symbolically analysing the fault equations by means of the Grobner bases theory, without increasing the computational complexity. The approach is applied to a circuit example already presented as a benchmark in the literature.