• DocumentCode
    3542461
  • Title

    Investigation of the optical properties of PLD-grown Bi2Te3 and Sb2Te3

  • Author

    Shaik, Muneer ; Motaleb, Ibrahim Abdel

  • Author_Institution
    Dept. of Electr. Eng., Northern Illinois Univ., DeKalb, IL, USA
  • fYear
    2013
  • fDate
    9-11 May 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The optical properties of Bismuth Telluride (Bi2 Te3) and Antimony Telluride (Sb2Te3) thin films grown using pulsed laser deposition (PLD) were investigated. In one set of samples, the two materials were grown, on n-Si substrates, with growth temperatures ranging from 25 to 450°C. In the second set, the films were deposited on microscopic glass slides at 150 °C. The optical properties were studied using Ultra Violet-Visible (UV-Vis) and Fourier Transform Infrared (FTIR) spectroscopy techniques. Absorbance spectra were obtained using UV-Vis spectroscopy, while transmittance spectra were obtained using FTIR spectroscopy. From the FTIR spectra and employing the Tauc plots, the optical band gaps for both materials were obtained. The values of the optical band gaps for Bi2 Te3 are between 0.22-0.26 eV and for Sb2Te3 are between 0.19-0.28 eV.
  • Keywords
    Fourier transform spectra; antimony compounds; bismuth compounds; infrared spectra; pulsed laser deposition; semiconductor growth; semiconductor thin films; ultraviolet spectra; visible spectra; Bi2Te3; FTIR; Fourier transform infrared spectroscopy; PLD; Sb2Te3; UV-vis spectroscopy; absorbance spectra; antimony telluride thin films; bismuth telluride thin films; microscopic glass; optical band gaps; optical properties; pulsed laser deposition; temperature 25 degC to 450 degC; transmittance spectra; ultraviolet-visible spectroscopy; Glass; Optical films; Photonic band gap; Silicon; Substrates; Bi2Te3; FTIR; PLD; Sb2Te3; Tauc plot; UV-Vis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electro/Information Technology (EIT), 2013 IEEE International Conference on
  • Conference_Location
    Rapid City, SD
  • ISSN
    2154-0357
  • Print_ISBN
    978-1-4673-5207-9
  • Type

    conf

  • DOI
    10.1109/EIT.2013.6632708
  • Filename
    6632708