Title :
Research on single chip microprocessor based intelligence testing method and equipment for switches
Author :
Xuehong, Yao ; Situ Zhong ; Yinna, Zheng
Author_Institution :
Mech. & Electron. Dept., Guangdong Tech. Univ., China
Abstract :
The author presents a new single chip microprocessor based test equipment for use in on-off rotary switch manufacturing to replace the traditional manual testing method
Keywords :
automatic test equipment; production testing; switches; automatic test equipment; production testing; rotary switches; single chip microprocessor; Electronic equipment testing; Microprocessors; Semiconductor device measurement; Switches; Test equipment;
Conference_Titel :
Intelligent Control and Automation, 2000. Proceedings of the 3rd World Congress on
Conference_Location :
Hefei
Print_ISBN :
0-7803-5995-X
DOI :
10.1109/WCICA.2000.863489
