• DocumentCode
    3543173
  • Title

    Low-temperature scanning tunneling microscope-induced luminescence of GaN

  • Author

    Evoy, S. ; Harnett, C.K. ; Craighead, H.G. ; Eustis, T.J. ; Davis, W.A. ; Murphy, M.J. ; Schaff, W.J. ; Eastman, L.F.

  • Author_Institution
    Sch. of Appl. & Eng. Phys., Cornell Univ., Ithaca, NY, USA
  • fYear
    1998
  • fDate
    3-8 May 1998
  • Firstpage
    277
  • Abstract
    Summary form only given. We present the scanning tunneling microscope-induced luminescence (STL) of MBE-grown GaN using a liquid helium (LHe) cooled UHV scanning tunnel microscope (STM) and discuss luminescence images at various wavelengths. To our knowledge, this is the first report of low-temperature STL of GaN. We also complement our STL study using low-temperature SEM-induced cathodoluminescence (SEM-CL).
  • Keywords
    III-V semiconductors; gallium compounds; luminescence; scanning tunnelling microscopy; GaN; low temperature STL; scanning tunneling microscope induced luminescence; Gallium nitride; Light emitting diodes; Luminescence; Microscopy; Photonic band gap; Physics; Semiconductor lasers; Tail; Temperature sensors; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 1998. CLEO 98. Technical Digest. Summaries of papers presented at the Conference on
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    1-55752-339-0
  • Type

    conf

  • DOI
    10.1109/CLEO.1998.676162
  • Filename
    676162