DocumentCode :
3543404
Title :
Single-shot B-integral wave-front correction of femtosecond laser pulses
Author :
Druon, F. ; Nantel, M. ; Vdovin, G. ; Maksimshuk, A. ; Chanteloup, J.C. ; Nees, J. ; Mourou, G.
Author_Institution :
Center for Ultrafast Opt. Sci., Michigan Univ., Ann Arbor, MI, USA
fYear :
1998
fDate :
3-8 May 1998
Firstpage :
279
Lastpage :
280
Abstract :
Summary form only given. Chirped pulse amplification allowed the development of ultrashort, high-intensity lasers. At this high-intensity level, the third-order nonlinear effect can cause wave-front distortions in even a small amount of material. Although often neglected, this effect can significantly reduce the spatial quality and thus the focusability of the beam, thereby severely reducing the attainable focused intensity. To quantify this decrease in the peak focused intensity, we use the normalized Strehl intensity, which is the ratio of the peak intensity at focus ofa beam with a distorted wave front to that of the same beam without distortions. We present, in this paper, the wave-front correction of femtosecond pulses distorted by third-order nonlinearities. To measure with a good accuracy this wave-front distortion, we use an achromatic three-wave lateral shearing interferometer (ATWLSI), which has been shown to be particularly suitable for single-shot measurements of both phase and intensity for femtosecond pulses.
Keywords :
chirp modulation; high-speed optical techniques; laser beams; light interferometry; Strehl intensity; achromatic three-wave lateral shearing interferometer; chirped pulse amplification; distortion measurement; femtosecond laser pulse; focusability; laser beam; single-shot B-integral wavefront correction; spatial quality; third-order nonlinearity; ultrashort high intensity laser; Chirp; Distortion measurement; Laser noise; Nonlinear distortion; Optical materials; Optical pulses; Particle measurements; Phase measurement; Pulse amplifiers; Pulse measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 1998. CLEO 98. Technical Digest. Summaries of papers presented at the Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-339-0
Type :
conf
DOI :
10.1109/CLEO.1998.676165
Filename :
676165
Link To Document :
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