DocumentCode :
3543412
Title :
Record high conversion gain ambipolar graphene mixer at 10GHz using scaled gate oxide
Author :
Madan, Himanshu ; Hollander, Matthew J. ; LaBella, M. ; Cavalero, R. ; Snyder, Dick ; Robinson, Joshua A. ; Datta, Soupayan
Author_Institution :
Pennsylvania State Univ., University Park, PA, USA
fYear :
2012
fDate :
10-13 Dec. 2012
Abstract :
This work presents a detailed study of the graphene RF mixer, comparing ambipolar and drain mixing for the first time. Output characteristics of the graphene transistor are analyzed and the effects of device scaling and interface state density on mixer performance are explained. We design a graphene RF transistor with gate length 750 nm, width 20 μm, and equivalent oxide thickness (EOT) ~2.5 nm to achieve record high conversion gain of -14 and -16 dB at LO power 0 dBm at 4.2 and 10 GHz, respectively, 100x higher than previously reported ambipolar mixing.
Keywords :
graphene; interface states; microwave mixers; microwave transistors; EOT; ambipolar mixing; equivalent oxide thickness; frequency 10 GHz; frequency 4.2 GHz; graphene RF mixer; graphene RF transistor; interface state density; record high conversion gain ambipolar graphene mixer; scaled gate oxide; size 20 nm; size 750 nm; Gain; Graphene; Harmonic analysis; Logic gates; Mixers; Radio frequency; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 2012 IEEE International
Conference_Location :
San Francisco, CA
ISSN :
0163-1918
Print_ISBN :
978-1-4673-4872-0
Electronic_ISBN :
0163-1918
Type :
conf
DOI :
10.1109/IEDM.2012.6478977
Filename :
6478977
Link To Document :
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