DocumentCode
354343
Title
Microwave breakdown in output multiplexer filters
Author
Boussavie, C. ; Baillargeat, D. ; Aubourg, M. ; Verdeyme, S. ; Guillon, P. ; Catherinot, A. ; Vigneron, S. ; Theron, B.
Author_Institution
IRCOM, Limoges Univ., France
Volume
2
fYear
2000
fDate
11-16 June 2000
Firstpage
1185
Abstract
A theoretical investigation is made of microwave breakdown in output multiplexer filters. The effects of the electrical breakdown cause irreversible damage to the device and so the power level, which generates such a phenomenon, must be predicted. This study needs a pluridisciplinary approach with a combination of three fields of the science: the electromagnetism, the thermic and the plasma physics.
Keywords
cavity resonator filters; electric breakdown; finite element analysis; microwave filters; space vehicle electronics; electrical breakdown; microwave breakdown; output multiplexer filters; pluridisciplinary approach; power level; Electric breakdown; Electric variables measurement; Electromagnetic measurements; Fasteners; Frequency; Microwave filters; Multiplexing; Plasma applications; Plasma devices; Plasma temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest. 2000 IEEE MTT-S International
Conference_Location
Boston, MA, USA
ISSN
0149-645X
Print_ISBN
0-7803-5687-X
Type
conf
DOI
10.1109/MWSYM.2000.863570
Filename
863570
Link To Document