DocumentCode :
3543721
Title :
DC-biased electrostrictive materials and transducers for medical imaging
Author :
Chen, Jie ; Gururaja, T.R.
Author_Institution :
Hewlett-Packard Co., Andover, MA, USA
Volume :
2
fYear :
1997
fDate :
5-8 Oct 1997
Firstpage :
1651
Abstract :
The field-induced electromechanical properties of several electrostrictive materials have been studied for ultrasonic transducer applications. This paper reviews the most important material properties and summarizes the advantages of using electrostrictive materials in medical imaging applications. By controlling electrostrictive material properties, transducers can be operated over a broad temperature range with minimum variation of sensitivity (within 3dB over the operating temperature range). Electrostrictive transducers with either 2 or 4 elevation aperture groups have been built and the results demonstrate the benefits of using electrostrictive tuning capability to achieve elevation aperture control and apodization. A novel type of f0/2f0 switchable transducer in which the operating frequency can be switched between two separated frequency bands expands the usable frequency range to over 100% -6dB bandwidth
Keywords :
biomedical transducers; biomedical ultrasonics; electrostriction; piezoceramics; piezoelectric transducers; ultrasonic transducers; DC-biased electrostrictive materials; PMN-PbTiO3; PbMgO3NbO3-PbTiO3; apodization; bandwidth; broad temperature range; electrostrictive tuning capability; elevation aperture control; elevation aperture groups; f0/2f0 switchable transducer; field-induced electromechanical properties; frequency bands; frequency range; material properties; medical imaging; sensitivity; ultrasonic transducer applications; Apertures; Biomedical imaging; Biomedical transducers; Electrostriction; Frequency; Material properties; Temperature control; Temperature distribution; Temperature sensors; Ultrasonic transducers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1997. Proceedings., 1997 IEEE
Conference_Location :
Toronto, Ont.
ISSN :
1051-0117
Print_ISBN :
0-7803-4153-8
Type :
conf
DOI :
10.1109/ULTSYM.1997.663311
Filename :
663311
Link To Document :
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