• DocumentCode
    3543795
  • Title

    De-noising based on wavelet analysis and bayesian estimation for low-dose X-ray CT

  • Author

    Fang, Ye ; Zhou, Yabin ; Ge, Dongwei ; Zhou, Zhan

  • Author_Institution
    Sch. of Electron. Inf., Xi´´an Polytech. Univ., Xi´´an, China
  • fYear
    2009
  • fDate
    16-19 Aug. 2009
  • Abstract
    Computed Tomography (CT) technology has been widely applied in modern clinical diagnosis. However, the high radiation exposure limits its further application. Low-dose protocol scans have been gradually used in clinics for mass screening due to its lower radiation exposure. Nevertheless, the quality of CT images would be severely decreased by the excessive quantum noise under low x-ray dose circumstances, which may degrade the diagnosis accuracy. This work explores a multiscale approach to reduce the strong noise in low-dose CT sinograms based on analyzing and modeling both the signal and noise in the wavelet domain. Then we develop a denoising method with applying Bayesian analysis to determine adaptive and optimum thresholds for the wavelet coefficients. Experimental results show that the proposed algorithm is effective in removing noise together with maintaining good quality of diagnostic images.
  • Keywords
    Bayes methods; computerised tomography; diagnostic radiography; image denoising; medical image processing; wavelet transforms; Bayesian estimation; clinical diagnosis; image denoising; low-dose CT sinograms; low-dose X-ray computed tomography; low-dose protocol scans; mass screening; quantum noise; radiation exposure; wavelet analysis; Bayesian methods; Clinical diagnosis; Computed tomography; Degradation; Noise reduction; Protocols; Signal analysis; Wavelet analysis; Wavelet domain; X-ray imaging; Bayesian estimation; CT (Computed tomography); image de-noising; sinogram domain; wavelet transform;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-3863-1
  • Electronic_ISBN
    978-1-4244-3864-8
  • Type

    conf

  • DOI
    10.1109/ICEMI.2009.5274424
  • Filename
    5274424