DocumentCode
3543795
Title
De-noising based on wavelet analysis and bayesian estimation for low-dose X-ray CT
Author
Fang, Ye ; Zhou, Yabin ; Ge, Dongwei ; Zhou, Zhan
Author_Institution
Sch. of Electron. Inf., Xi´´an Polytech. Univ., Xi´´an, China
fYear
2009
fDate
16-19 Aug. 2009
Abstract
Computed Tomography (CT) technology has been widely applied in modern clinical diagnosis. However, the high radiation exposure limits its further application. Low-dose protocol scans have been gradually used in clinics for mass screening due to its lower radiation exposure. Nevertheless, the quality of CT images would be severely decreased by the excessive quantum noise under low x-ray dose circumstances, which may degrade the diagnosis accuracy. This work explores a multiscale approach to reduce the strong noise in low-dose CT sinograms based on analyzing and modeling both the signal and noise in the wavelet domain. Then we develop a denoising method with applying Bayesian analysis to determine adaptive and optimum thresholds for the wavelet coefficients. Experimental results show that the proposed algorithm is effective in removing noise together with maintaining good quality of diagnostic images.
Keywords
Bayes methods; computerised tomography; diagnostic radiography; image denoising; medical image processing; wavelet transforms; Bayesian estimation; clinical diagnosis; image denoising; low-dose CT sinograms; low-dose X-ray computed tomography; low-dose protocol scans; mass screening; quantum noise; radiation exposure; wavelet analysis; Bayesian methods; Clinical diagnosis; Computed tomography; Degradation; Noise reduction; Protocols; Signal analysis; Wavelet analysis; Wavelet domain; X-ray imaging; Bayesian estimation; CT (Computed tomography); image de-noising; sinogram domain; wavelet transform;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-3863-1
Electronic_ISBN
978-1-4244-3864-8
Type
conf
DOI
10.1109/ICEMI.2009.5274424
Filename
5274424
Link To Document