The design of general-purpose automatic testing and fault diagnosis system based on VXI bus

Author

Guo, Rui ; Wang, Guoqiang ; Jiang, Yuhai ; Ye, Wei

Author_Institution

Mech. Eng. Coll., Jilin Univ., Changchun, China

fYear

2009

fDate

16-19 Aug. 2009

Abstract

According to the principles of generalization, modularization, and standardization, we have designed a general testing system for large-scale and complicated electronic equipment based on VXI bus. It introduces the design principle and the structure of the hardware and the software of the general testing system in the paper. It adopts Bayesian networks representation method to represent the uncertainty information in the system. The system has important meaning to improve the test and diagnostic capability for the electromechanical device.

Keywords

Bayes methods; automatic testing; fault diagnosis; field buses; virtual instrumentation; Bayesian networks representation method; VXI bus; electromechanical device; electronic equipment; fault diagnosis system; general-purpose automatic testing; hardware structure; software structure; testing system design principle; virtual instrumentation; Automatic testing; Bayesian methods; Electronic equipment; Electronic equipment testing; Fault diagnosis; Hardware; Large-scale systems; Software testing; Standardization; System testing; ATS; BN; Information Fusion; VXI bus;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on

Conference_Location

Beijing

Print_ISBN

978-1-4244-3863-1

Electronic_ISBN

978-1-4244-3864-8

Type

conf

DOI

10.1109/ICEMI.2009.5274427

Filename

5274427