• DocumentCode
    3543935
  • Title

    Deep Trench capacitor drive of a 3.3 GHz unreleased Si MEMS resonator

  • Author

    Wentao Wang ; Weinstein, D.

  • Author_Institution
    HybridMEMS Lab., Massachusetts Inst. of Technol., Cambridge, MA, USA
  • fYear
    2012
  • fDate
    10-13 Dec. 2012
  • Abstract
    This work presents unreleased RF bulk acoustic resonators using Deep Trench (DT) capacitors for both transduction and acoustic isolation. While the majority of Si MEMS resonators require a release step to freely suspend the resonant cavity, these unreleased resonators are formed entirely in solid media. This eliminates the need for complex release steps and costly packaging. The resonators use 1D periodic DT structures etched into a bulk Si substrate for both electrostatic transduction and to form Acoustic Bragg Reflectors (ABRs) for energy localization. In this paper, we introduce the concept of Deep Trenches as ABRs, and provide analysis, simulation, and experimental verification of their use for high-Q resonators. A 3.3 GHz unreleased Si resonator is demonstrated with Q of 2057 and motional impedance RX of 1.2 kΩ. This realization of high-Q unreleased resonators in a bulk Si process provides a high yield, low cost, no packaging solution for on-chip clocking, wireless communication, and electromechanical signal processing.
  • Keywords
    Q-factor; acoustic resonators; elemental semiconductors; microcavities; micromechanical resonators; silicon; 1D periodic DT structures; ABR; RF bulk acoustic resonators; acoustic bragg reflectors; acoustic isolation; bulk substrate; deep trench capacitor drive; electromechanical signal processing; electrostatic transduction; energy localization; frequency 3.3 GHz; high-Q resonators; motional impedance; on-chip clocking; release step; resistance 1.2 kohm; resonant cavity; solid media; transduction isolation; unreleased MEMS resonator; wireless communication; Acoustics; Capacitors; Cavity resonators; Reflectivity; Resonant frequency; Silicon; Transducers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 2012 IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0163-1918
  • Print_ISBN
    978-1-4673-4872-0
  • Electronic_ISBN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.2012.6479045
  • Filename
    6479045