DocumentCode :
3544015
Title :
Characterization of temperature sensor using VT extractor circuit
Author :
Mamat, Hazian ; Yusoff, Yuzman ; Yusof, Ismail Md ; Suradi, Walid ; Yew, Tan Kong
Author_Institution :
MOEMS & Phys. Sensors Group, MIMOS Berhad, Kuala Lumpur, Malaysia
fYear :
2009
fDate :
16-19 Aug. 2009
Abstract :
The semiconductor (or IC for integrated circuit) temperature sensor is an electronic device fabricated in a similar way to other modern electronic semiconductor components such as microprocessors, diode, transistors, capacitors and etc. There are few temperature sensors being used in nowadays i.e diode type and threshold voltage (VT) extractor type. Normally hundreds or thousands of devices are formed on single thin silicon wafers. These sensors share a number of characteristics - linear outputs, relatively small size, limited temperature range (-40 to +120degC typical), low cost, good accuracy if calibrated but also poor interchangeability. Often the semiconductor temperature sensors are not well designed thermally, with the semiconductor chip not always in good thermal contact with an outside surface. Some devices are inclined to oscillate unless precautions are taken. Provided the limitations of the semiconductor temperature sensors are understood, they can be used effectively in many applications. The most popular semiconductor temperature sensors are based on the fundamental temperature and current characteristics of the transistor. In this paper, the VT extractor type sensor is going to be discussed and the characterization of output voltage to temperature scale will be show. The sensors are calibrated based on environment effect and use water as a medium to translate the temperature to voltage. Also, two kind of circuit being used i.e flex circuit and dual layer PCB. The comparison between these two approaches described in full in this paper.
Keywords :
semiconductor devices; temperature sensors; dual layer PCB; electronic semiconductor components; extractor circuit; flex circuit; integrated circuit; semiconductor temperature sensors; Capacitors; Costs; Flexible printed circuits; Microprocessors; Semiconductor diodes; Sensor phenomena and characterization; Silicon; Temperature distribution; Temperature sensors; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-3863-1
Electronic_ISBN :
978-1-4244-3864-8
Type :
conf
DOI :
10.1109/ICEMI.2009.5274452
Filename :
5274452
Link To Document :
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