DocumentCode :
3544023
Title :
Infrared isolation effectiveness of car windows film tester
Author :
Wang, Yongqing ; Zhang, Zhipeng ; Zhang, Suoliang ; Wang, Hong
Author_Institution :
Coll. of Electron. & Inf. Eng., Hebei Univ., Baoding, China
fYear :
2009
fDate :
16-19 Aug. 2009
Abstract :
This paper introduces the circuit and working principle of the infrared isolation effectiveness of car windows film tester. The circuit of the tester was constituted mainly by frequency modulating infrared light source, silicon photovoltaic cells, I/V convertor, A/D convertor and so on. The infrared wavelength range of the infrared light source is broader than the single infrared LED testing, which use two different wavelengths of infrared LED light sources to form composite wavelength light source. The methods which the circuit uses based on frequency domain is to suppress the interference of the stray light signal. When the light path is open, the actual measurement show that, the maximum difference is only 0.8% between the test result in sunlight and that in the darkroom. This paper also gives the test results and its analysis of which the 25 kinds of car windows films which are tested by the prototype machine.
Keywords :
automotive components; automotive electronics; frequency modulation; frequency-domain analysis; infrared sources; light emitting diodes; optical modulation; optical testing; photovoltaic cells; solar control films; stray light; A/D converter; car windows film tester; composite wavelength light source; frequency domain; frequency modulating infrared light source; infrared isolation; prototype machine; silicon photovoltaic cells; single infrared LED testing; stray light signal; Circuit testing; Converters; Frequency conversion; Frequency domain analysis; Frequency modulation; Light emitting diodes; Light sources; Optical modulation; Photovoltaic cells; Silicon; car windows film; infrared ray; isolation effectiveness; suppress interference; test;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-3863-1
Electronic_ISBN :
978-1-4244-3864-8
Type :
conf
DOI :
10.1109/ICEMI.2009.5274453
Filename :
5274453
Link To Document :
بازگشت