Experimental and theoretical investigations on cross talk performance of grating-based monolithic integrated wavelength demultiplexers

Author

He, J.-J. ; Lamontagne, B. ; Delage, A. ; Erickson, L. ; Champion, G. ; Van Der Meer, P. ; Davies, M. ; Koteles, E.S.

Author_Institution

Inst. for Microstruct. Sci., Nat. Res. Council of Canada, Ottawa, Ont., Canada

fYear

1998

fDate

3-8 May 1998

Firstpage

317

Lastpage

318

Abstract

Summary form only given. We report on recent results on InGaAsP-InP-based Rowland circle grating demultiplexers. Simulations and experiments on the effects of inherent fabrication errors such as the pixelation effect, switching errors, and field distortion in the grating patterning process are presented. These results suggest sources of the cross talk in the wavelength demultiplexers and ways to reduce them as well as the limitations of currently available technologies.

Keywords

III-V semiconductors; demultiplexing equipment; diffraction gratings; gallium arsenide; gallium compounds; indium compounds; integrated optics; optical communication equipment; optical crosstalk; wavelength division multiplexing; InGaAsP-InP; InGaAsP-InP-based Rowland circle grating demultiplexers; cross talk performance; field distortion; grating patterning process; grating-based monolithic integrated wavelength demultiplexers; inherent fabrication errors; pixelation effect; switching errors; wavelength demultiplexers; Arrayed waveguide gratings; Continuous wavelet transforms; Degradation; Electrons; Integrated optics; Optical fiber polarization; Optical sensors; Optical wavelength conversion; Semiconductor optical amplifiers; Wavelength division multiplexing;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 1998. CLEO 98. Technical Digest. Summaries of papers presented at the Conference on

Conference_Location

San Francisco, CA, USA

Print_ISBN

1-55752-339-0

Type

conf

DOI

10.1109/CLEO.1998.676220

Filename

676220