• DocumentCode
    3544033
  • Title

    Towards atomistic simulations of the electro-thermal properties of nanowire transistors

  • Author

    Luisier, Mathieu

  • Author_Institution
    Integrated Syst. Lab., ETH Zurich, Zürich, Switzerland
  • fYear
    2012
  • fDate
    10-13 Dec. 2012
  • Abstract
    In this paper, the electronic and thermal properties of ultra-scaled nanowire transistors are investigated using a single, atomistic, quantum transport simulator based on the Non-equilibrium Green´s Function (NEGF) formalism as well as the tight-binding and valence-force-field methods to accurately describe the electron and phonon population, respectively. Although the length of the considered device structures does not exceed a few nanometers, dissipative scattering mechanisms such as electron-phonon and anharmonic phonon-phonon scattering still play an important role and should therefore be fully taken into account by the modeling approach. It will be shown here that these two effects strongly affect the performance of nanowire transistors, either by decreasing (backscattering) or increasing (opening of additional propagation channels) the electrical and thermal currents flowing through them.
  • Keywords
    Green´s function methods; field effect transistors; nanoelectronics; nanowires; semiconductor device models; tight-binding calculations; NEGF formalism; anharmonic phonon-phonon scattering; atomistic simulations; device structures; dissipative scattering mechanisms; electron population; electron-phonon scattering; electrothermal property; nonequilibrium Green´s function formation; phonon population; quantum transport simulator; tight-binding method; ultrascaled nanowire transistors; valence-force-field methods; Conductivity; Phonons; Scattering; Silicon; Solid modeling; Thermal conductivity; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 2012 IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0163-1918
  • Print_ISBN
    978-1-4673-4872-0
  • Electronic_ISBN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.2012.6479057
  • Filename
    6479057