Title :
A novel photorefractive coherence-gated interferometric system in highly scattering environment
Author :
Shiratori, A. ; Aida, R. ; Ide, Y. ; Obara, M.
Author_Institution :
Dept. of Electr. Eng., Keio Univ., Yokohama, Japan
Abstract :
Summary form only given. We developed a novel all-optical noise removal technique for interferometry in a highly scattering environment using photorefractive coherence gating. In the practical applications of the laser interferometry, such as on-machine monitoring of material processing, scattering objects such as vapor and dust exist in the optical path, which results in a large quantity of scattered lights. In the highly scattering environment, such scattered lights lower the visibility of the interferograms. Thus, accurate interferometric measurement in the highly scattering environment was quite difficult, or sometimes impossible, which is an important issue to be solved for the practical interferometric applications. Our approach to overcome this difficulty is a photorefractive coherence-gated imaging technique.
Keywords :
laser materials processing; light interferometry; light scattering; monitoring; photorefractive materials; accurate interferometric measurement; all-optical noise removal technique; dust; highly scattering environment; laser interferometry; laser material processing; on-machine monitoring; optical path; photorefractive coherence gating; photorefractive coherence-gated imaging technique; photorefractive coherence-gated interferometric system; scattered lights; scattering objects; vapor; Laser applications; Laser noise; Light scattering; Materials processing; Monitoring; Optical interferometry; Optical noise; Optical scattering; Photorefractive effect; Working environment noise;
Conference_Titel :
Lasers and Electro-Optics, 1998. CLEO 98. Technical Digest. Summaries of papers presented at the Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-339-0
DOI :
10.1109/CLEO.1998.676233