DocumentCode :
3544330
Title :
PPPS-2013: Infrared gas phase studies and scaling parameters in PE-CVD processes at atmospheric pressure using high-current dielectric barrier discharges
Author :
Welzel, S. ; Engeln, R. ; Starostin, S.A. ; de Vries, H. ; van de Sanden, Mauritius C. M.
Author_Institution :
Eindhoven Univ. of Technol., Eindhoven, Netherlands
fYear :
2013
fDate :
16-21 June 2013
Firstpage :
1
Lastpage :
1
Abstract :
Plasma-enhanced chemical vapour deposition (PE-CVD) of silica-like layers at atmospheric pressure onto large-area polymeric substrates has been shown to yield high-quality barrier layers. A key requirement is to achieve a diffusive discharge mode in industrially relevant air-like gas mixtures (N2/O2/Ar) without admixtures of Helium. An electronic stabilisation enables high discharge currents (several A) to be achieved.
Keywords :
Fourier transform spectra; density; dissociation; etching; infrared spectra; plasma CVD; silicon compounds; thin films; time resolved spectra; HCOOH; PE-CVD; SiO2; air-like gas mixtures; density; diffusive discharge mode; discharge currents; dissociation; etching; films; formic acid; high-current dielectric barrier discharges; high-current plasmas; infrared gas phase; mean energy; plasma-enhanced chemical vapour deposition; polymeric substrate; pulsed quantum cascade lasers; reactor constant; scaling parameters; silica-like layers; time-resolved in-situ IR laser spectroscopy; Chemicals; Etching; Films; Polymers; Quantum cascade lasers; Spectroscopy; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science (ICOPS), 2013 Abstracts IEEE International Conference on
Conference_Location :
San Francisco, CA
ISSN :
0730-9244
Type :
conf
DOI :
10.1109/PLASMA.2013.6633185
Filename :
6633185
Link To Document :
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