• DocumentCode
    3544399
  • Title

    Exceeding Nernst limit (59mV/pH): CMOS-based pH sensor for autonomous applications

  • Author

    Parizi, K.B. ; Yeh, Alexander J. ; Poon, Ada S. Y. ; Wong, H.-S.

  • Author_Institution
    Stanford Univ., Stanford, CA, USA
  • fYear
    2012
  • fDate
    10-13 Dec. 2012
  • Abstract
    A highly sensitive field-effect sensor immune to environmental potential fluctuation is proposed. The sensor circuit consists of two sensors each with a charge sensing field effect transistor (FET) and an extended sensing gate (SG). By enlarging the sensing gate of an extended gate ISFET, a remarkable sensitivity of 130mV/pH is achieved, exceeding the conventional Nernst limit of 59mV/pH. The proposed differential sensing circuit consists of a pair of matching n-channel and p-channel ion sensitive sensors connected in parallel and biased at a matched transconductance bias point. Potential fluctuations in the electrolyte appear as common mode signal to the differential pair and are cancelled by the matched transistors. This novel differential measurement technique eliminates the need for a true reference electrode such as the bulky Ag/AgCl reference electrode and enables the use of the sensor for autonomous and implantable applications.
  • Keywords
    CMOS integrated circuits; chemical sensors; electrolytes; field effect transistor circuits; ion sensitive field effect transistors; thermomagnetic effects; CMOS-based pH sensor; ISFET; autonomous application; common mode signal; differential measurement technique; electrolyte; environmental potential fluctuation; exceeding Nernst limit; extended sensing gate; field effect sensor; field effect transistor; matched transconductance bias point; matched transistors; n-channel ion sensitive sensors; p- channel ion sensitive sensors; sensor circuit; Electrodes; Field effect transistors; Fluctuations; Logic gates; Noise; Sensitivity; Sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 2012 IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0163-1918
  • Print_ISBN
    978-1-4673-4872-0
  • Electronic_ISBN
    0163-1918
  • Type

    conf

  • DOI
    10.1109/IEDM.2012.6479098
  • Filename
    6479098