DocumentCode
3544399
Title
Exceeding Nernst limit (59mV/pH): CMOS-based pH sensor for autonomous applications
Author
Parizi, K.B. ; Yeh, Alexander J. ; Poon, Ada S. Y. ; Wong, H.-S.
Author_Institution
Stanford Univ., Stanford, CA, USA
fYear
2012
fDate
10-13 Dec. 2012
Abstract
A highly sensitive field-effect sensor immune to environmental potential fluctuation is proposed. The sensor circuit consists of two sensors each with a charge sensing field effect transistor (FET) and an extended sensing gate (SG). By enlarging the sensing gate of an extended gate ISFET, a remarkable sensitivity of 130mV/pH is achieved, exceeding the conventional Nernst limit of 59mV/pH. The proposed differential sensing circuit consists of a pair of matching n-channel and p-channel ion sensitive sensors connected in parallel and biased at a matched transconductance bias point. Potential fluctuations in the electrolyte appear as common mode signal to the differential pair and are cancelled by the matched transistors. This novel differential measurement technique eliminates the need for a true reference electrode such as the bulky Ag/AgCl reference electrode and enables the use of the sensor for autonomous and implantable applications.
Keywords
CMOS integrated circuits; chemical sensors; electrolytes; field effect transistor circuits; ion sensitive field effect transistors; thermomagnetic effects; CMOS-based pH sensor; ISFET; autonomous application; common mode signal; differential measurement technique; electrolyte; environmental potential fluctuation; exceeding Nernst limit; extended sensing gate; field effect sensor; field effect transistor; matched transconductance bias point; matched transistors; n-channel ion sensitive sensors; p- channel ion sensitive sensors; sensor circuit; Electrodes; Field effect transistors; Fluctuations; Logic gates; Noise; Sensitivity; Sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting (IEDM), 2012 IEEE International
Conference_Location
San Francisco, CA
ISSN
0163-1918
Print_ISBN
978-1-4673-4872-0
Electronic_ISBN
0163-1918
Type
conf
DOI
10.1109/IEDM.2012.6479098
Filename
6479098
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