DocumentCode :
3544427
Title :
Maximization of SRAM energy efficiency utilizing MTCMOS technology
Author :
Wang, Bo ; Zhou, Jun ; Kim, Tony T.
Author_Institution :
VIRTUS, Nanyang Technol. Univ., Singapore, Singapore
fYear :
2012
fDate :
10-11 July 2012
Firstpage :
35
Lastpage :
40
Abstract :
Higher-Vth devices in the cross-coupled latches and the write access transistors, and lower-Vth devices in the read ports are preferred for reducing leakage current without sacrificing performance. However, at ultra-low supply voltage levels, higher-Vth devices can retard or nullify energy efficiency due to substantially slower write speed than read. This paper presents energy efficiency maximization techniques for 8T SRAMs utilizing multi-threshold CMOS (MTCMOS) technology and various design techniques. Simulation results using a commercial 65 nm technology show that the SRAM energy efficiency can improved up to 33× through MTCMOS and prior power reduction and performance boosting techniques.
Keywords :
CMOS integrated circuits; SRAM chips; leakage currents; optimisation; MTCMOS technology; SRAM energy efficiency maximization; higher-Vth device; leakage current reduction; performance boosting technique; power reduction; size 65 nm; ultra-low supply voltage levels; Boosting; Delay; Energy consumption; Energy efficiency; Leakage current; Performance evaluation; Random access memory; SRAM energy; energy efficiency; leakage reduction; multi-threshold CMOS (MTCMOS); power reduction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ASQED), 2012 4th Asia Symposium on
Conference_Location :
Penang
Print_ISBN :
978-1-4673-2687-2
Type :
conf
DOI :
10.1109/ACQED.2012.6320472
Filename :
6320472
Link To Document :
بازگشت