Title :
Uniform methodology for benchmarking beyond-CMOS logic devices
Author :
Nikonov, Dmitri E. ; Young, Ian A.
Author_Institution :
Components Res., Intel Corp., Hillsboro, OR, USA
Abstract :
A consistent methodology for benchmarking beyond CMOS logic devices was developed to guide the research directions. The promising devices - tunneling FET and spin wave devices - perform > 1015 Integer Ops/s/cm2 with power <; 1W/cm2.
Keywords :
CMOS logic circuits; field effect transistors; spin waves; tunnelling; benchmarking; beyond-CMOS logic devices; spin wave devices; tunneling FET; uniform methodology; Adders; CMOS integrated circuits; Delay; Logic gates; Magnetoelectronics; Switches; Torque;
Conference_Titel :
Electron Devices Meeting (IEDM), 2012 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4673-4872-0
Electronic_ISBN :
0163-1918
DOI :
10.1109/IEDM.2012.6479102
