DocumentCode :
3544499
Title :
The research of power quality analysis based on improved S-Transform
Author :
Shi, Zhang ; Ruirui, Liu ; Qun, Wang ; Heptol, Jeffers Teargun ; Guimin, Yang
Author_Institution :
Dept. of Electron. Inf. Eng., Northeastern Univ., Shenyang, China
fYear :
2009
fDate :
16-19 Aug. 2009
Abstract :
The paper proposes improved S-transform (IST) to detect and classify power quality (PQ) disturbances with time-domain analysis. First, the theory of S-transform (ST) is introduced. To enhance the analytic power of ST in different non-stationary signal processing, IST is achieved by adding an adjustable factor to the Gaussian window function of the normal ST. The adjusted factor changes the velocity in which the width of the window function varies inversely with the frequency. IST possesses an adjustable time-frequency resolution and higher practicability and adaptability than ST in the actual application. IST analysis performed on the PQ disturbance signals can identify the magnitude and duration of the disturbances. The comparison between the wavelet-transform-based method and the improved S-transform-based method for power quality disturbance recognition is also provided. The simulation results show that the proposed method is effective and immune against noise. The proposed method is feasible and promising for practical applications.
Keywords :
power supply quality; wavelet transforms; Gaussian window function; adjustable time-frequency resolution; improved S-transform; power quality analysis; wavelet transform-based method; Continuous wavelet transforms; Discrete Fourier transforms; Discrete wavelet transforms; Fast Fourier transforms; Power quality; Signal analysis; Signal processing; Time frequency analysis; Voltage fluctuations; Voltage-controlled oscillators; S-Transform; Wavelet; power quality; voltage disturbance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-3863-1
Electronic_ISBN :
978-1-4244-3864-8
Type :
conf
DOI :
10.1109/ICEMI.2009.5274515
Filename :
5274515
Link To Document :
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