• DocumentCode
    3544580
  • Title

    Robustness validation of integrated circuits and systems

  • Author

    Barke, M. ; Kärgel, M. ; Lu, W. ; Salfelder, F. ; Hedrich, L. ; Olbrich, M. ; Radetzki, M. ; Schlichtmann, U.

  • Author_Institution
    Inst. for Electron. Design Autom., Tech. Univ. Munchen, München, Germany
  • fYear
    2012
  • fDate
    10-11 July 2012
  • Firstpage
    145
  • Lastpage
    154
  • Abstract
    Robust system design is becoming increasingly important, because of the ongoing miniaturization of integrated circuits, the increasing effects of aging mechanisms, and the effects of parasitic elements, both intrinsic and external. For safety reasons, particular emphasis is placed on robust system design in the automotive and aerospace sectors. Until now, the term robustness has been applied very intuitively and there has been no proper way to actually measure robustness. However, the complexity of contemporary systems makes it difficult to fulfill tight specifications. For this reason, robustness must be integrated into a partially automated design flow. In this paper, a new approach to robustness modeling is presented, in addition to new ways to quantify or assess the robustness of a design. To demonstrate the flexibility of the proposed approach, it is adapted and applied to several different scenarios. These include the robustness evaluation of digital circuits under aging effects, such as NBTI; the robustness modeling of analog and mixed signal circuits using affine arithmetic; and the robustness study of software algorithms on a high system level.
  • Keywords
    ageing; integrated circuit design; integrated circuit measurement; NBTI; aerospace sector; affine arithmetic; aging effect; analog circuit; automotive sector; contemporary complexity system; digital circuit; integrated circuit design; mixed signal circuit; parasitic element effect; partially automated design flow; robust system design; Human computer interaction; Robustness; Testing; NBTI; Robustness; affine arithmetic; aging; analog; digital; softerrors; system;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ASQED), 2012 4th Asia Symposium on
  • Conference_Location
    Penang
  • Print_ISBN
    978-1-4673-2687-2
  • Type

    conf

  • DOI
    10.1109/ACQED.2012.6320491
  • Filename
    6320491