DocumentCode
3544604
Title
Observation of the ELM activity in the far SOL region of KSTAR tokamak plamsa using probe diagnostics
Author
Park, I.S. ; Hong, Seung Ho ; Kim, D.H. ; Kim, Yong Sin ; Lee, K.D. ; Nam, Y.U. ; Chung, C.W.
Author_Institution
Dept. of Electr. Eng., Hanyang Univ., Seoul, South Korea
fYear
2013
fDate
16-21 June 2013
Firstpage
1
Lastpage
1
Abstract
Summary form only given. Edge characteristics of a tokamak plasma are of interest due to their importance in ITER (international thermonuclear experimental reactor). Especially, the particle flux and temperature after the ELM (edge localized mode) crash are of interest. In 2011 KSTAR campaign, plasma parameters such as the ion flux and electron temperature were measured at the far scrape-off layer (far-SOL) of tokamak plasma by using electrical probe diagnostics. The distance between SOL and the position of the probe was ~40cm. The ion flux and electron temperature were similar with those of core mm interferometer and the edge ECE diagnostic results. The results show good correlation with edge H-alpha signals measured by a filterscope which represent characteristic behavior of the edge plasma such as ELM. Note that the measurement location of H-alpha signals is placed different from the position of the electrical probe. In order to see the exact correlation, a photo diode with an H-alpha filter is installed inside the probe in 2012 KSTAR campaign. As a result, correlations between electrical and H-alpha signals are measured at the same poloidal and toroidal position. The far-SOL characteristics such as the ion flux and electron temperature were calculated from electrical signals. This paper reports the experimental findings on the edge plasma characteristics during ELMs which could give a clue for the far-SOL particle transport.
Keywords
Tokamak devices; plasma boundary layers; plasma probes; plasma temperature; plasma toroidal confinement; H-alpha filter; ITER; KSTAR tokamak plasma; core interferometer; edge H-alpha signals; edge localized mode activity; edge plasma behavior; edge plasma characteristics; electrical probe diagnostics; electrical probe position; electrical signal; electron temperature; far scrape-off layer region; far-scrape-off layer characteristics; far-scrape-off layer particle transport; ion flux; measurement location; particle flux; photo diode; plasma parameters; poloidal position; toroidal position; Plasma measurements; Plasma temperature; Probes; Semiconductor device measurement; Temperature; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science (ICOPS), 2013 Abstracts IEEE International Conference on
Conference_Location
San Francisco, CA
ISSN
0730-9244
Type
conf
DOI
10.1109/PLASMA.2013.6633220
Filename
6633220
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