• DocumentCode
    3544646
  • Title

    Built-in current sensor with reduced voltage drop using thin-film transistors

  • Author

    Hatzopoulos, A.A. ; Siskos, S. ; Dimitriadis, C.A. ; Papadopoulos, N.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Aristotle Univ. of Thessaloniki, Greece
  • fYear
    2005
  • fDate
    23-26 May 2005
  • Firstpage
    2196
  • Abstract
    A simple current. mirror using TFTs with input terminals which are capacitively coupled to the TFT gate, is used in this work, to design a built-in current sensor (BICS). The important feature in this application is that the voltage drop across the sensing TFT device can be reduced to almost zero value, while preserving transistor operation in the saturation region. This makes the proposed BICS appropriate for TFT applications without affecting the circuit operation. It also results in adequate linearity for the current monitoring, making the structure applicable to digital as well as to analog and mixed-signal circuit testing.
  • Keywords
    built-in self test; circuit testing; current mirrors; electric current measurement; thin film transistors; BICS; TFT gate capacitively coupled input terminals; analog circuit testing; built-in current sensor; current mirror; current monitoring linearity; digital circuit testing; mixed-signal circuit testing; reduced voltage drop current sensor; saturation region transistor operation; thin-film transistors; variable threshold transistor; CMOS logic circuits; Circuit testing; Linearity; Logic testing; Mirrors; Monitoring; Optical wavelength conversion; Physics; Thin film transistors; Threshold voltage; Built-in current sensor; analog and mixed signal testing; thin-film transistor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on
  • Print_ISBN
    0-7803-8834-8
  • Type

    conf

  • DOI
    10.1109/ISCAS.2005.1465057
  • Filename
    1465057