DocumentCode
3544646
Title
Built-in current sensor with reduced voltage drop using thin-film transistors
Author
Hatzopoulos, A.A. ; Siskos, S. ; Dimitriadis, C.A. ; Papadopoulos, N.
Author_Institution
Dept. of Electr. & Comput. Eng., Aristotle Univ. of Thessaloniki, Greece
fYear
2005
fDate
23-26 May 2005
Firstpage
2196
Abstract
A simple current. mirror using TFTs with input terminals which are capacitively coupled to the TFT gate, is used in this work, to design a built-in current sensor (BICS). The important feature in this application is that the voltage drop across the sensing TFT device can be reduced to almost zero value, while preserving transistor operation in the saturation region. This makes the proposed BICS appropriate for TFT applications without affecting the circuit operation. It also results in adequate linearity for the current monitoring, making the structure applicable to digital as well as to analog and mixed-signal circuit testing.
Keywords
built-in self test; circuit testing; current mirrors; electric current measurement; thin film transistors; BICS; TFT gate capacitively coupled input terminals; analog circuit testing; built-in current sensor; current mirror; current monitoring linearity; digital circuit testing; mixed-signal circuit testing; reduced voltage drop current sensor; saturation region transistor operation; thin-film transistors; variable threshold transistor; CMOS logic circuits; Circuit testing; Linearity; Logic testing; Mirrors; Monitoring; Optical wavelength conversion; Physics; Thin film transistors; Threshold voltage; Built-in current sensor; analog and mixed signal testing; thin-film transistor;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on
Print_ISBN
0-7803-8834-8
Type
conf
DOI
10.1109/ISCAS.2005.1465057
Filename
1465057
Link To Document