DocumentCode
3544647
Title
Design of testing system for accelerometer based on GP-IB
Author
Cheng, Hongjie ; Zhao, Yuan ; Qiang, Baomin ; Liu, Yan
Author_Institution
Second Artillery Eng. Coll., Xi´´an, China
fYear
2009
fDate
16-19 Aug. 2009
Abstract
Through analyzing the situation of accelerometer testing system, there are several bottleneck factors such as various testing procedure, complicated operation, and easy to cause mishandling which have restricted the accelerometer´s automatic testing capability. To calibrate the performance parameters better, the testing system for accelerometer based on GPIB is designed, and the composition of the system is introduced. According to the characters of high accuracy and faint feedback signals of accelerometer, the digital multimeter technique is applied to realize the accurate test of the accelerometer´s faint output signals through its favorable signal processing and noise limiting capacity. At the same time, for the small sample of test data, double modified interpolation is used to process the obtained data, enlarge the sample size and solve the problem that it´s difficult to build times-series model with a small sample. Comparing with operational testing system, advanced technology, comprehensive function and powerful data processing & analyzing capacity are main advantages of this testing system. The application indicates that this precise and steady testing system can meet the requirement of accelerometer calibrating & testing completely.
Keywords
accelerometers; calibration; digital multimeters; interpolation; peripheral interfaces; time series; GP-IB; accelerometer testing system; digital multimeter technique; double modified interpolation; feedback signal; general port interface bus; performance parameter calibration; signal processing; time-series model; Accelerometers; Automatic testing; Data processing; Digital signal processing; Interpolation; Limiting; Output feedback; Power system modeling; Signal processing; System testing; GP-IB; accelerometer; data acquisition; data processing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-3863-1
Electronic_ISBN
978-1-4244-3864-8
Type
conf
DOI
10.1109/ICEMI.2009.5274532
Filename
5274532
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