DocumentCode :
3544803
Title :
Highly endurable floating body cell memory: Vertical biristor
Author :
Dong-Il Moon ; Sung-Jin Choi ; Jee-Yeon Kim ; Seung-Won Ko ; Moon-Seok Kim ; Jae-Sub Oh ; Gi-Sung Lee ; Min-Ho Kang ; Young-Su Kim ; Jeoung-Woo Kim ; Yang-Kyu Choi
fYear :
2012
fDate :
10-13 Dec. 2012
Abstract :
A BJT named `biristor´, a term derived from `bi-stable resistor´, is demonstrated for 4F2 high speed volatile memory applications. For a floating body cell, a gate-less vertical silicon pillar, which is an n-p-n BJT with an open-base, is employed, whereas for its control device, a MOSFET composed of a vertical silicon pillar surrounded by a gate is utilized. A 4F2 memory cell array is realized by the unidirectional operation of a vertical two-terminal biristor, which consists of a cross-bar array. Due to the nature of the gate-less structure, the biristor cell shows excellent endurance of up to 1016.
Keywords :
DRAM chips; MOSFET; bipolar transistors; elemental semiconductors; high-speed techniques; resistors; silicon; 4F2 high speed volatile memory applications; 4F2 memory cell array; MOSFET; Si; bistable resistor; control device; cross-bar array; gate-less structure; gate-less vertical pillar; highly endurable floating body cell memory; n-p-n BJT; unidirectional operation; vertical biristor; vertical two-terminal biristor; Arrays; Field effect transistors; Impact ionization; Latches; Logic gates; MOSFET circuits; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 2012 IEEE International
Conference_Location :
San Francisco, CA
ISSN :
0163-1918
Print_ISBN :
978-1-4673-4872-0
Electronic_ISBN :
0163-1918
Type :
conf
DOI :
10.1109/IEDM.2012.6479147
Filename :
6479147
Link To Document :
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