Title :
Packaging performance of GaAs/InGaAs/InGaP collector-up HBTs as power amplifiers
Author :
Hsien-Cheng Tseng ; Wen-Jinn Chu
Author_Institution :
Nanotechnol. R & D Center & Dept. of Electron. Eng., Kun Shan Univ., Tainan, Taiwan
Abstract :
GaAs/InGaAs/InGaP collector-up heterojunction bipolar transistors (HBTs), with an effective thermal-dissipation packaging (TDP) configuration, have been developed. The TDP-implemented multi-finger collector-up HBT with a graded InGaAs base is demonstrated to achieve compelling high-speed and heat-removing performances. Extraordinarily, the TDP has a stronger influence on the p-n-p device than on the n-n-p device. The results show that the thermal resistance has been substantially decreased by 50%, and a power-added efficiency (PAE) more than 56% is obtained. Thermal performance for miniature power amplifiers in next-generation cellular phones can be greatly improved from our design.
Keywords :
III-V semiconductors; cooling; gallium arsenide; heterojunction bipolar transistors; indium compounds; mobile handsets; packaging; power amplifiers; GaAs-InGaAs-InGaP; heat removing performance; miniature power amplifiers; multifinger collector-up heterojunction bipolar transistors; n-n-p device; next generation cellular phones; p-n-p device; packaging performance; power added efficiency; thermal dissipation packaging configuration; thermal performance; Fingers; Gallium arsenide; Heterojunction bipolar transistors; Indium gallium arsenide; Multiaccess communication; Performance evaluation; Power amplifiers; GaAs/InGaAs/InGaP; graded base; heterojunction bipolar transistor (HBT); thermal;
Conference_Titel :
Quality Electronic Design (ASQED), 2012 4th Asia Symposium on
Conference_Location :
Penang
Print_ISBN :
978-1-4673-2687-2
DOI :
10.1109/ACQED.2012.6320520