• DocumentCode
    3544823
  • Title

    Performance and area tradeoffs in space-qualified FPGA-based time-of-flight systems

  • Author

    Hsiong, Whitney ; Huntzicker, Steve ; King, Kevin ; Lee, Austin ; Lim, Chen ; Wang, Jason ; Harris, Sarah ; Jahn, Jög-Micha

  • Author_Institution
    Harvey Mudd Coll., Claremont, CA, USA
  • fYear
    2009
  • fDate
    16-19 Aug. 2009
  • Firstpage
    42401
  • Lastpage
    42405
  • Abstract
    This paper introduces four FPGA-based designs for radiation-tolerant time-of-flight (TOF) systems for sub-atomic particles: Snapshot, Vernier, Fast-Clocking and Hybrid designs. The designs measure TOFs ranging from 0 to 240 ns and are compared based on resolution, thermal performance, FPGA I/O pin usage and area, particle processing rate, and power consumption. All designs are implemented and tested on an Actel ProASIC 3E A3PE1500 FPGA using only the features available on the radiation-tolerant Actel RTAX 2000 S/SL. The designs achieve resolutions of 130 ps to 25 ns and particle rates of 1.63 to 40 MHz, use from 0.02% to 7.5% of the FPGA area, and consume from 396 to 448 mW. The TOF measurements of the fast-clocking design show no thermal variation across the ranges of -25degC to 55degC. The other three designs vary linearly with temperature, but this variation can be calibrated using a temperature sensor. All four designs offer a flexible, inexpensive TOF measurement system that can be implemented across a broad range of FPGAs.
  • Keywords
    field programmable gate arrays; logic design; logic testing; measurement systems; space vehicle electronics; temperature sensors; Actel ProASIC 3E A3PE1500; Actel RTAX 2000 S/SL; FPGA-based design; TOF measurement system; fast-clocking design; frequency 1.63 MHz to 40 MHz; power 396 mW to 448 mW; radiation-tolerant time-of-flight system; space-qualified FPGA-based time-of-flight system; spaceflight instrumentation; temperature -25 C to 55 C; temperature sensor; time 0 ns to 240 ns; Area measurement; Clocks; Costs; Delay lines; Field programmable gate arrays; Flip-flops; Hardware design languages; Integrated circuit measurements; Plasma measurements; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-3863-1
  • Electronic_ISBN
    978-1-4244-3864-8
  • Type

    conf

  • DOI
    10.1109/ICEMI.2009.5274555
  • Filename
    5274555